Bulk electronic structures of strongly correlated electron systems
are often much different from surface electronic structures probed
by low energy photoemission spectroscopy (PES). Soft X-ray PES is
effectively applied to the study of bulk electronic structures of
Nd1-xSrxMnO3,1)
where microscopic and dynamic phase segregation is observed.
Angle resolved soft X-ray photoemission (ARPES) is applied to probe
the dispersion associated with the metal-insulator transition in
V6O13 and to probe bulk Fermi surfaces of high
Tc cuprates as well as Sr2RuO4,
clarifying essential differences from the surface
region.
Resonant inelastic X-ray scattering (RIXS) is a really bulk
sensitive probe to see the momentum resolved low energy excitations
even in insulators. RIXS near the Cu 1s edge is measured for the
quasi-1D Cu-O chain system, CuGeO3 and
Sr2CuO3, where clear differences are observed
reflecting the edge sharing and corner sharing geometry.
1) A.Sekiyama et al., to be published.
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